IEEE Std 1620-2004
Standard for Test Methods for the Characterization of Organic Transistors and Materials

Standard No.

IEEE Std 1620-2004

Release Date

2004

Published By

Institute of Electrical and Electronics Engineers (IEEE)

Status

Be replaced 2008-12

Replace By

IEEE Std 1620-2008

Latest

IEEE Std 1620-2008

Scope

This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

IEEE Std 1620-2004 history

• 2008 IEEE Std 1620-2008 IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
• 2004 IEEE Std 1620-2004 Standard for Test Methods for the Characterization of Organic Transistors and Materials