T/CSTM 00003-2019
Thickness measurements of two-dimensional materials Atomic force microscopy (AFM) (English Version)

Standard No.

T/CSTM 00003-2019

Language

Chinese, Available in English version

Release Date

2019

Published By

Group Standards of the People's Republic of China

Latest

T/CSTM 00003-2019

Scope

This standard specifies the principles, instruments and equipment, sample preprocessing, test methods, thickness calculation methods, uncertainty assessment of measurement results and test reports of the atomic force microscope method for measuring the thickness of two-dimensional materials. This standard is applicable to the thickness measurement of two-dimensional materials that can form steps with the substrate.

T/CSTM 00003-2019 history

• 2019 T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)