IEEE Std 1005-1998
IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays

Standard No.

IEEE Std 1005-1998

Release Date

1998

Published By

Institute of Electrical and Electronics Engineers (IEEE)

Latest

IEEE Std 1005-1998

Scope

Summary form only given. This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E/sup 2/PROMs, and block rewritable "flash" EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance and disturb. There are also clauses on the issues of testing floating gate arrays and their hard...

IEEE Std 1005-1998 history

• 1998 IEEE Std 1005-1998 IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays
• 1991 IEEE Std 1005-1991 IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays