CNS 5076-1988
Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Vibration Test) (English Version)

Standard No.

CNS 5076-1988

Language

Chinese, Available in English version

Release Date

1988

Published By

Taiwan Provincial Standard of the People's Republic of China

Latest

CNS 5076-1988

Scope

This standard specifies test methods for evaluating the vibration resistance of a single semiconductor during handling or use.

CNS 5076-1988 history

• 1988 CNS 5076-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Vibration Test)