CNS 5074-1988
Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Test of Free Fall) (English Version)

Standard No.

CNS 5074-1988

Language

Chinese, Available in English version

Release Date

1988

Published By

Taiwan Provincial Standard of the People's Republic of China

Latest

CNS 5074-1988

Scope

This standard specifies the test method for the structural and mechanical ability of a single semiconductor device for electronic devices to withstand irregular and repeated impacts caused by use, transportation and practical use.

CNS 5074-1988 history

• 1988 CNS 5074-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Test of Free Fall)