CNS 5072-1988
Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Sealing Test) (English Version)
- Standard No.
- CNS 5072-1988
- Language
- Chinese, Available in English version
- Release Date
- 1988
- Published By
- Taiwan Provincial Standard of the People's Republic of China
- Latest
- CNS 5072-1988
- Scope
- This standard specifies test methods for sealing airtightness of single semiconductor devices. 1.1 Definition 1.1.1 Calculation of air leakage rate: The calculation of air leakage rate refers to the leakage rate of dry air per second at 25°C when the high-pressure side is 1 barometric pressure (101325 Pa) and the low-pressure side is 1.33322×102 Pa or less. Air throughput. The unit is Pa. cm3∕s means. 1.1.2 Measuring the air leakage rate: Measuring the air leakage rate system
CNS 5072-1988 history
- 1988 CNS 5072-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Sealing Test)
