CNS 5067-1988
Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Test of Soft Solders for Heat Endurance) (English Version)

Standard No.

CNS 5067-1988

Language

Chinese, Available in English version

Release Date

1988

Published By

Taiwan Provincial Standard of the People's Republic of China

Latest

CNS 5067-1988

Scope

This standard specifies a test method for evaluating the heat resistance of a single semiconductor device during solder attachment operations.

CNS 5067-1988 history

• 1988 CNS 5067-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Test of Soft Solders for Heat Endurance)