CNS 5540-1988
Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Reverse Bias Test of Variable Capacitance Diodes Under High Temperature) (English Version)

Standard No.

CNS 5540-1988

Language

Chinese, Available in English version

Release Date

1988

Published By

Taiwan Provincial Standard of the People's Republic of China

Latest

CNS 5540-1988

Scope

This standard specifies test methods for voltage variable capacitance diodes to withstand temperature stress and voltage stress under reverse bias dynamics and to use certain methods to accelerate their degradation to achieve service life evaluation.

CNS 5540-1988 history

• 1988 CNS 5540-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Reverse Bias Test of Variable Capacitance Diodes Under High Temperature)