CNS 6117-1988
Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Damp Heat Test) (English Version)

Standard No.

CNS 6117-1988

Language

Chinese, Available in English version

Release Date

1988

Published By

Taiwan Provincial Standard of the People's Republic of China

Latest

CNS 6117-1988

Scope

This standard specifies test methods for the long-term use and storage of single semiconductor devices under high relative humidity.

CNS 6117-1988 history

• 1988 CNS 6117-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Damp Heat Test)