CNS 6802-1980
Standard Test Procedured for Noise Margin Measurements for Semiconductor Logic Gating Microcircuits (English Version)

Standard No.

CNS 6802-1980

Language

Chinese, Available in English version

Release Date

1980

Published By

Taiwan Provincial Standard of the People's Republic of China

Latest

CNS 6802-1980

Scope

This standard specifies the testing procedures for the noise limits of semiconductor logic gate microcircuits (including monolithic, multi-chip, film or hybrid microcircuits), such as "Microelectronics Engineering" CNS_listed).

CNS 6802-1980 history

• 1980 CNS 6802-1980 Standard Test Procedured for Noise Margin Measurements for Semiconductor Logic Gating Microcircuits