GB/T 36705-2018
Test method for carrier concentration of gallium nitride substrates—Raman spectrum method (English Version)

Standard No.
GB/T 36705-2018
Language
Chinese, Available in English version
Release Date
2018
Published By
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
Latest
GB/T 36705-2018
Scope
This standard specifies the method for adjusting the carrier concentration of N-type phosphide substrates by means of tensile spectroscopy. The test range of carrier waviness of Gui film: 1X10" cm-1X102 cm-:.

GB/T 36705-2018 Referenced Document

  • GB/T 14264 Semiconductor materials-Terms and definitions
  • GB/T 4326 Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient
  • GB/T 8170 Rules of rounding off for numerical values & expression and judgement of limiting values

GB/T 36705-2018 history

  • 2018 GB/T 36705-2018 Test method for carrier concentration of gallium nitride substrates—Raman spectrum method
Test method for carrier concentration of gallium nitride substrates—Raman spectrum method



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