CNS 13623-1995
Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method) (English Version)

Standard No.

CNS 13623-1995

Language

Chinese, Available in English version

Release Date

1995

Published By

Taiwan Provincial Standard of the People's Republic of China

Status

Withdraw

Latest

CNS 13623-1995

Scope

This standard is applicable to the measurement and calculation of resistivity, Hall coefficient and Hall mobility of a single chip.

CNS 13623-1995 history

• 1995 CNS 13623-1995 Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method)