CNS 13806-1997
Method of Measurement for Emission Wavelength and Luminous Intensity of Epitaxial Wafers of Light Emitting Diodes (English Version)

Standard No.

CNS 13806-1997

Language

Chinese, Available in English version

Release Date

1997

Published By

Taiwan Provincial Standard of the People's Republic of China

Latest

CNS 13806-1997

Scope

This standard is applicable to the measurement of luminous wavelength and brightness of light-emitting diode chips.

CNS 13806-1997 history

• 1997 CNS 13806-1997 Method of Measurement for Emission Wavelength and Luminous Intensity of Epitaxial Wafers of Light Emitting Diodes