CNS 13805-1997
Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers (English Version)

Standard No.

CNS 13805-1997

Language

Chinese, Available in English version

Release Date

1997

Published By

Taiwan Provincial Standard of the People's Republic of China

Latest

CNS 13805-1997

Scope

1.1 This standard applies to the measurement of optical laser spectrum (Photoluminescence) of optoelectronic semiconductor chips. 1.2 The range of optical laser spectrum measurement is only the area illuminated by the excitation light source and the extremely shallow depth from the surface. This depth is limited by the penetration power of the light source and the diffusion distance of photoexcited carriers.

CNS 13805-1997 history

• 1997 CNS 13805-1997 Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers