CNS 13780-1996
Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test (English Version)

Standard No.

CNS 13780-1996

Language

Chinese, Available in English version

Release Date

1996

Published By

Taiwan Provincial Standard of the People's Republic of China

Latest

CNS 13780-1996

Scope

This standard is applicable to the test method for the degree of electrical stress (forward current) and temperature stress (including temperature rise due to load) that infrared light-emitting diodes (for automatic control) can withstand over time.

CNS 13780-1996 history

• 1996 CNS 13780-1996 Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test