CNS 13781-1996
Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias) (English Version)

Standard No.

CNS 13781-1996

Language

Chinese, Available in English version

Release Date

1996

Published By

Taiwan Provincial Standard of the People's Republic of China

Latest

CNS 13781-1996

Scope

This standard specifies the burn-in test method for infrared light-emitting diodes that require high reliability.

CNS 13781-1996 history

• 1996 CNS 13781-1996 Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias)