PN-EN IEC 60749-30-2021-05 E
Semiconductor devices -- Mechanical and climatic test methods -- Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2020)

Standard No.

PN-EN IEC 60749-30-2021-05 E

Release Date

2021

Published By

PL-PKN

Replace By

PN-EN 60749-30-2007 P PN-EN 60749-30-2007/A1-2011 E