PN-EN IEC 60749-20-2021-06 E
Semiconductor devices -- Mechanical and climatic test methods -- Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 60749-20:2020)

Standard No.
PN-EN IEC 60749-20-2021-06 E
Release Date
2021
Published By
PL-PKN
Replace By
PN-EN 60749-20-2010 E



Copyright ©2023 All Rights Reserved