JEDEC JESD22-C101F-2013
Field-Induced Charged-Device Model Test Method for Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components
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JEDEC JESD22-C101F-2013
Standard No.
JEDEC JESD22-C101F-2013
Release Date
2013
Published By
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
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