BS EN 60749-30+A1:2006
Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing

Standard No.

BS EN 60749-30+A1:2006

Release Date

2006

Published By

British Standards Institution (BSI)

Status

Be replaced 2006-01

Replace By

BS EN 60749-30:2005+A1:2011

Latest

BS EN 60749-30:2005+A1:2011

BS EN 60749-30+A1:2006 history

• 2006 BS EN 60749-30:2005+A1:2011 Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing
• 2006 BS EN 60749-30:2005 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing