JEDEC JESD22-A117C-2011
Electrically Erasable Programmable ROM (EEPROM) Program/Erase Endurance and Data Retention Stress Test
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JEDEC JESD22-A117C-2011
Standard No.
JEDEC JESD22-A117C-2011
Release Date
2011
Published By
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
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