JEDEC JESD51-14-2010
Transient Dual Interface Test Method for the Measurement of the Thermal Resistance Junction to Case of Semiconductor Devices with Heat Flow Trough a Single Path
Home
JEDEC JESD51-14-2010
Standard No.
JEDEC JESD51-14-2010
Release Date
2010
Published By
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
Copyright ©2024 All Rights Reserved