JEDEC JESD22-C101D-2008
Field-Induced Charged-Device Model Test Method for Electrostatic- Discharge-Withstand Thresholds of Microelectronic Components

Standard No.

JEDEC JESD22-C101D-2008

Release Date

2008

Published By

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

Status

Withdraw