NF C96-022-18*NF EN 60749-18:2003
Semiconductor devices - Mechanical and climatic test methods - Part 18 : ionizing radiation (total dose).

Standard No.

NF C96-022-18*NF EN 60749-18:2003

Release Date

2003

Published By

Association Francaise de Normalisation

Latest

NF C96-022-18*NF EN 60749-18:2003

Replace

NF C96-022:1999

NF C96-022-18*NF EN 60749-18:2003 history

• 2002 NF C96-022-9:2002 Semiconductor devices - Mechanical and climatic test methods - Part 9 : permamence of marking.
• 0000 NF C96-022:1999