DIN EN 60749-13:2003
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2002); German version EN 60749-13:2002

Standard No.

DIN EN 60749-13:2003

Release Date

2003

Published By

German Institute for Standardization

Status

Be replaced

Replace By

DIN EN IEC 60749-13:2018

DIN EN 60749-13 E:2017

Latest

DIN EN IEC 60749-13:2018

DIN EN 60749-13 E:2017-07

Replace

DIN EN 60749:2002

Scope

The document describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.

DIN EN 60749-13:2003 history

• 2018 DIN EN 60749-3:2018 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (IEC 60749-3:2017); German version EN 60749-3:2017
• 2003 DIN EN 60749-3:2003 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual inspection (IEC 60749-3:2002); German version EN 60749-3:2002
• 0000 DIN EN 60749:2002