DIN EN 60749-12:2003
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 60749-12:2002); German version EN 60749-12:2002

Standard No.

DIN EN 60749-12:2003

Release Date

2003

Published By

German Institute for Standardization

Status

Be replaced

Replace By

DIN EN IEC 60749-12:2018

DIN EN 60749-12 E:2017

Latest

DIN EN IEC 60749-12:2018

DIN EN 60749-12 E:2017-08

Replace

DIN EN 60749:2002

Scope

The document describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages

DIN EN 60749-12:2003 history

• 2018 DIN EN 60749-3:2018 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (IEC 60749-3:2017); German version EN 60749-3:2017
• 2003 DIN EN 60749-3:2003 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual inspection (IEC 60749-3:2002); German version EN 60749-3:2002
• 0000 DIN EN 60749:2002