JEDEC JESD74A-2007
Early Life Failure Rate Calculation Procedure for Semiconductor Components

Standard No.

JEDEC JESD74A-2007

Release Date

2007

Published By

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

Scope

Early life failure rate (ELFR) measurement of a product is typically performed during product qualifications or as part of ongoing product reliability monitoring activities. These tests measure reliability performance over the product’s first several months in the field. It is therefore important to establish a methodology that will accurately project early life failure rate to actual customer use conditions.