(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
Scope
This document defines the methodology for the optimization (elimination, reduction, or alternative
approach) of the MIL-PRF-38535 screening and testing requirements for MIL-PRF-38535, Classes Q and
V, Microcircuits. Inherent in this methodology is the application of "In-line Process Controls" and "SPC"
techniques to the applicable manufacturing processes. This document includes the process for initial
approval and subsequent maintenance of the testing and screening optimizations.