JEDEC JESD22-C101C-2004
Field-Induced Charged-Device Model Test Method for Electrostatic- Discharge-Withstand Thresholds of Microelectronic Components

Standard No.

JEDEC JESD22-C101C-2004

Release Date

2004

Published By

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

Status

Withdraw

Scope

This standard describes a uniform method for establishing charged device model (CDM) electrostatic discharge (ESD) “withstand” thresholds. Copyright Solid State Technology Association Reproduced by IHS under license with JEDEC No reproduction or networking permitted without license from IHS Not for Resale --`,,,`,,-`-`,,`,,`,`,,`---