JEDEC JESD22-B108A-2003
Coplanarity Test for Surface-Mount Semiconductor Devices

Standard No.

JEDEC JESD22-B108A-2003

Release Date

2003

Published By

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

Status

Withdraw

Scope

The purpose of this test is to measure the deviation of the terminals (leads or solder balls) from coplanarity for surface-mount semiconductor devices.