(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
Status
Scope
1 Tolerances apply to the entire useable test area.
2 For information only.
3 The test conditions are to be applied continuously except during any interim readouts.
NOTE: For interim readouts, devices should be returnedt o stress withint he time specified in 4.5.
4 For parts that reach absorption equilibrium in 24 hours or less, the HAST test is equivalent to at
least 1000 hours at 85 "C185 %RH. For parts that require more than 24 hours to reach equilibrium at
the specifiedH AST condition, the time should be extended to allow parttos reach equilibrium.
5 Caution: For plastic-encapsulated microcircuits, it is known that moisture reduces the effective
glass transition temperature of the molding compound. Stress temperatures above the effective glass
transition temperature may lead to failure mechanisms unrelated to standard 85OC/85% RH stress.