JEDEC JESD22-A108C-2005
Temperature, Bias, and Operating Life
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JEDEC JESD22-A108C-2005
Standard No.
JEDEC JESD22-A108C-2005
Release Date
2005
Published By
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
Status
Withdraw
Scope
The following items shall be specified in the applicable life test specification
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