JEDEC JESD22-A100-B-2000
Cycled Temperature-Humidity-Bias Life Test

Standard No.
JEDEC JESD22-A100-B-2000
Release Date
2000
Published By
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
Status
Scope
The Cycled Temperature-Humidity-Bias Life Test is typically performed on cavity packages (e.g. MQUADs, lidded ceramic pin grid arrays, etc.) as an alternative to JESD22-A 10 1 or JESD22-A11 O.



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