JIS K 1200-5:2000
Sodium hydroxide for industrial use -- Part 5: Determination of silicon content -- Inductively coupled plasma atomic emission spectrochemical analysis
- Standard No.
- JIS K 1200-5:2000
- Release Date
- 2000
- Published By
- Japanese Industrial Standards Committee (JISC)
- Latest
- JIS K 1200-5:2000
- Scope
- This standard specifies how to determine the silicon content of sodium hydroxide used as an industrial chemical by high-frequency inductively coupled plasma emission spectrometry.
JIS K 1200-5:2000 history
- 2000 JIS K 1200-10:2000 Sodium hydroxide for industrial use -- Part 10: Determination of manganese content
- 1968 JIS K 1200:1968 Testing methods of caustic soda
