DD ENV 50219-1996
Description of the reliability test structures of the European mini test chip
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DD ENV 50219-1996
Standard No.
DD ENV 50219-1996
Release Date
1996
Published By
British Standards Institution (BSI)
Scope
Documents the parametrized test structures of the JESSI Reliability Test Chip (RTC) which is part of the European Mini Test Chip (ETC).
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