IPC TM-650 2.2.17A-2001
Surface Roughness and Profile of Metallic Foils (Contacting Stylus Technique)

Standard No.
IPC TM-650 2.2.17A-2001
Release Date
2001
Published By
IPC - Association Connecting Electronics Industries
Scope
This method defines the procedure for determining the roughness or profile of metallic foils. The surface finish or roughness of foils shall be evaluated using Ra. Ra is defined as the arithmetic average value of all absolute distances of the roughness profile from the center line within the measuring length. The foil profile of foils shall be evaluated using the parameter RZ (DIN) or RTM@ which is defined as the average maximum peak to valley height of five consecutive sampling lengths within the measurement length. This value is approximately equivalent to the values of profile determined from microsectioning techniques. RZ (ISO) is a different parameter from RZ (DIN) and is not applicable to this method.



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