KS C 0256-2002(2017)
Testing method of resistivity for silicon crystals and silicon wafers with four - point probe

Standard No.

KS C 0256-2002(2017)

Release Date

2002

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS C 0256-2002(2022)

Latest

KS C 0256-2002(2022)

KS C 0256-2002(2017) history

• 0000 KS C 0256-2002(2022)
• 0000 KS C 0256-2002(2017)
• 2002 KS C 0256-2002 Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
• 0000 KS C 0256-1999