IEEE PC62.35/D1-2018
Draft Standard for Test Methods for Silicon Avalanche Semiconductor Surge Protective Device Components

Standard No.
IEEE PC62.35/D1-2018
Release Date
2018
Published By
IEEE - The Institute of Electrical and Electronics Engineers@ Inc.
Scope
This standard applies to the avalanche breakdown diodes 1 used for surge protection onsystems with voltages equal to or less than 1000 V rms or 1200 V dc. The avalanche breakdown diode surge suppressor is a semiconductor diode which can operate in either the forward orreverse direction of its V-I characteristic. This component is a single package@ which may beassembled from any combination of series and/or parallel diode chips.This standard contains definitions@ service conditions@ and a series of test criteria for determiningthe electrical characteristics and verifying ratings of these avalanche breakdown diodes. If thecharacteristics differ with the direction of conduction@ then each direction of conduction shall beseparately specified.



Copyright ©2024 All Rights Reserved