KS C 2150-2008(2018)
Measuring method of dielectric constant and dielectric loss of dielectric thin film at the high frequency ranges(500 MHz∼10 GHz)

Standard No.

KS C 2150-2008(2018)

Release Date

2008

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS C 2150-2008(2023)

Latest

KS C 2150-2008(2023)

KS C 2150-2008(2018) history

• 0000 KS C 2150-2008(2023)
• 0000 KS C 2150-2008(2018)
• 2008 KS C 2150-2008 Measuring method of dielectric constant and dielectric loss of dielectric thin film at the high frequency ranges(500 MHz∼10 GHz)