IEEE Std C62.35- 2010
IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components

Standard No.
IEEE Std C62.35- 2010
Release Date
2010
Published By
Institute of Electrical and Electronics Engineers (IEEE)
Replace
IEEE Std C62.35-1987
Scope
Avalanche breakdown diodes used for surge protection in systems with voltages equal to or less than 1000 V rms or 1200 V dc are discussed in this standard. The avalanche breakdown diode surge suppressor is a semiconductor diode which can operate in either the forward or reverse direction of its V-l characteristic. This component is a single package, which may be assembled from any combination of s...

IEEE Std C62.35- 2010 history

  • 2018 IEEE Std C62.35-2010/COR 1-2018 IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components--Corrigendum 1
  • 2010 IEEE Std C62.35-2010 IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components
  • 0000 IEEE Std C62.35-1987(R1993)
  • 1989 IEEE Std C62.35-1987 IEEE Standard Test Specifications for Avalanche Junction Semiconductor Surge Protective Devices

IEEE Std C62.35- 2010 IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components has been changed from IEEE Std C62.35-1987 IEEE Standard Test Specifications for Avalanche Junction Semiconductor Surge Protective Devices.




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