IPC - Association Connecting Electronics Industries
Scope
The purpose of this test method is to measure the thickness and phosphorous (P) concentration of chemically (electroless) deposited nickel (Ni) coatings by (energy dispersive) X-ray fluorescence (XRF) analysis. The measurement is nondestructive and noncontact@ and can be performed either in ambient atmosphere or under vacuum. Measurements shall be made on a defined feature (equivalent to a typical SMT pad) of 1.5 mm x 1.5 mm [0.060 in x 0.060 in] or equivalent area@ using a 0.6 mm diameter collimator. This equates to a measuring spot size (analysis area) of 1 mm diameter. This test method is designed primarily for failure analysis@ process qualification and process auditing. It is not intended for daily production control@ due to the complexity and cost of the equipment required.