Systems on Chip (SoC) for communications@ multimedia and computer applications have recently received much international attention; one such example being the single-chip transceiver. Modern microelectronic design adopts a mixed-signal approach as a complex SoC is a mixed-signal system including both analogue and digital circuits. Automatic testing becomes crucially important to drive down the overall cost of next generation SoC devices. Test and fault diagnosis of analogue@ mixed-signal and RF circuits@ however@ proves much more difficult than that of digital circuits due to tolerances@ parasites and nonlinearities and therefore@ together with challenging tuning and calibration@ remains the bottleneck for automatic SoC testing. This book provides a comprehensive discussion of automatic testing@ diagnosis and tuning of analogue@ mixed-signal and RF integrated circuits@ and systems in a single source. The book contains eleven chapters written by leading researchers worldwide. As well as fundamental concepts and techniques@ the book reports systematically the state of the arts and future research directions of these areas@ A complete range of circuit components are covered and test issues are also addressed from the SoC perspective. An essential reference companion to researchers and engineers in mixed-signal testing@ the book can also be used as a text for postgraduate and senior undergraduate students.