20/30425836 DC
BS EN IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods. Part 37. Board level drop test method using an accelerometer

Standard No.

20/30425836 DC

Release Date

2020

Published By

British Standards Institution (BSI)

Latest

20/30425836 DC

20/30425836 DC history

• 0000 20/30425836 DC