UNE 82-314-1991 Instruments for the measurement of surface roughness by the profile method. Contact (stylus) instruments of consecutive profile transformation. Contact profile meters, system M
This standard defines the main terms that refer to profilometers in the M system, establishes the main parameters of these instruments with their numerical values, and specifies their metrological characteristics. NOTE- If in the future it is decided to establish another analogous standard, relative to profilometers in other measurement systems,