QJ 1906A-1997
Destructive Physical Analysis (DPA) Methods and Procedures for Semiconductor Devices (English Version)

Standard No.

QJ 1906A-1997

Language

Chinese, Available in English version

Release Date

1997

Published By

Professional Standard - Aerospace

Replace

QJ 1906-1990

QJ 1906A-1997 history

• 1970 QJ 1906-1990 器件

QJ 1906A-1997 Destructive Physical Analysis (DPA) Methods and Procedures for Semiconductor Devices has been changed from QJ 1906-1990 器件.